pco.edge 5.5 CLHS

pco.edge 5.5 CLHS sCMOS Camera

The pco.edge 5.5 is a high resolution cooled sCMOS camera utilizing a CLHS interface and 10G FOL (Camera Link HS) to allow direct processing of large data transfers via a computer making it easy to securely bridge distances of up to 10 km. This camera is equipped with a 16-bit scientific CMOS sensor for capturing crisp images and precise measurements. The pco.edge 5.5 camera also comes with an option to upgrade with a water cooling system.

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Interface

CLHS FOL

Sensor technology

sCMOS

Color type

monochrome or color

Resolution 

2560 x 2160 pixels

Sensor diagonal

21.8 mm

Pixel size

6.5 x 6.5 μm

Maximum frame rate @ full resolution 

100 fps

Maximum pixel rate

572 MPixel/s

Peak QE

60 % @ 600 nm1

Typ. read noise2 

1.0 e-

Dark current @ sensor temperature

< 0.6 RS/GR e-/pixel/s

< 0.9 GS @ 7 °C e-/pixel/s

 

Maximum dynamic range

30,000 : 1

Shutter type

Rolling Shutter, Global Shutter, Global Reset

Sensor cooling3

air, optional: water

Additional options

double shutter, lens control

Dimensions (H x W x L)

76 x 70 x 122 mm
 
1 Monochrome version
2 The readout noise values are given as median (med). All values are raw data without any filtering.
3 air = air forced with fan | water = external water connection
 
Front View
Front View 45 Degree
Rear View
Side View
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Color
pco.edge 5.5 CLHS QE Curve - Color
pco.edge 5.5 CLHS QE Curve - Color
   
  • Bright-field microscopy
  • Fluorescence microscopy
  • Digital pathology
  • Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
  • Lightsheet fluorescence microscopy (LSFM)
  • Structured illumination microscopy (SIM)
  • Calcium imaging
  • Förster resonance energy transfer (FRET)
  • Fluorescence recovery after photobleaching (FRAP)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Image intensifier imaging
  • Lucky astronomy
  • Disaster recovery
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)

 

 

 

Interface

CLHS FOL

Sensor technology

sCMOS

Color type

monochrome or color

Resolution 

2560 x 2160 pixels

Sensor diagonal

21.8 mm

Pixel size

6.5 x 6.5 μm

Maximum frame rate @ full resolution 

100 fps

Maximum pixel rate

572 MPixel/s

Peak QE

60 % @ 600 nm1

Typ. read noise2 

1.0 e-

Dark current @ sensor temperature

< 0.6 RS/GR e-/pixel/s

< 0.9 GS @ 7 °C e-/pixel/s

 

Maximum dynamic range

30,000 : 1

Shutter type

Rolling Shutter, Global Shutter, Global Reset

Sensor cooling3

air, optional: water

Additional options

double shutter, lens control

Dimensions (H x W x L)

76 x 70 x 122 mm
 
1 Monochrome version
2 The readout noise values are given as median (med). All values are raw data without any filtering.
3 air = air forced with fan | water = external water connection
 
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Monochrome
pco.edge 5.5 CLHS QE Curve - Color
pco.edge 5.5 CLHS QE Curve - Color
pco.edge 5.5 CLHS QE Curve - Color
   
  • Bright-field microscopy
  • Fluorescence microscopy
  • Digital pathology
  • Single molecule localization microscopy (SMLM) – PALM, STORM, dSTORM, GSDIM
  • Lightsheet fluorescence microscopy (LSFM)
  • Structured illumination microscopy (SIM)
  • Calcium imaging
  • Förster resonance energy transfer (FRET)
  • Fluorescence recovery after photobleaching (FRAP)
  • High-speed bright-field ratio imaging
  • High throughput screening
  • High content screening
  • Biochip reading
  • Total internal reflection microscopy (TITF)
  • Spinning disk confocal microscopy
  • 3D metrology
  • Ophthalmology
  • Photovoltaic inspection
  • Industrial quality inspection
  • Wafer inspection
  • Image intensifier imaging
  • Lucky astronomy
  • Disaster recovery
  • Tunnel inspection
  • Particle tracking velocimetry (PTV)

 

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