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4D Ultrafast TEM

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In-Situ Transmission Electron Microscopy

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Abstract

Ultrafast technology has demonstrated a profound impact in a wide range of applications including material diagnostics and processing, high-speed communication and biological signaling and sensing. In an attempt to illuminate the complexity of structure–dynamics–function relationships, the invention of 4D ultrafast TEM extends the ability to effectively explore such complexity with high resolutions in space, time and energy domains. This methodology combines the advantages of both TEM and ultrafast laser technologies, which possess the capabilities of performing 4D imaging, diffraction and spectroscopy with flexible modes including a stroboscopic mode for reversible processes and single-pulse mode for irreversible processes. Following an introductory section which outlines the historical development of ultrafast technologies from ultrafast optical probes to ultrafast electron diffraction and electron microscopy (UEM), the chapter goes on to describe the basic principle of 4D UEM and then cover a wide range of applications for the determination of transient, complex structures in material and biological systems with joint sub-nanometer spatial and femtosecond temporal resolutions. Finally, this chapter is concluded by summarizing the progress made so far, highlighting the challenges that should be overcome, and providing future trends and potentials in the UEM field. The interdisciplinary nature of 4D UEM opens perspectives for advancing the understanding of nonequilibrium complex dynamics in chemistry, physics, biology and materials science.

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Authors and Affiliations

  1. Center for Ultrafast Science and Technology, Shanghai Jiao Tong University, Shanghai, 200240, China

    Bin Chen, Jianming Cao & Dongping Zhong

  2. Physics Department and National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL, 32310, USA

    Jianming Cao

  3. Department of Physics, Department of Chemistry and Biochemistry, Programs of Biophysics, Chemical Physics, and Biochemistry, The Ohio State University, Columbus, OH, 43210, USA

    Dongping Zhong

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  1. Bin Chen
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  2. Jianming Cao
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Correspondence to Bin Chen .

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Editors and Affiliations

  1. School of Electronic Science and Engineering, Southeast University, Nanjing, Jiangsu, China

    Litao Sun

  2. School of Electronic Science and Engineering, Southeast University, Nanjing, Jiangsu, China

    Tao Xu

  3. School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, China

    Ze Zhang

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Chen, B., Cao, J., Zhong, D. (2023). 4D Ultrafast TEM. In: Sun, L., Xu, T., Zhang, Z. (eds) In-Situ Transmission Electron Microscopy. Springer, Singapore. https://doi.org/10.1007/978-981-19-6845-7_10

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